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QT-9000 Series
QT-9000 Series Large Scale IC Test System£¨Direct Mount£©QT-9000
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QT-8000 Series Mixed-Signal TC Test System£¨Cable Mount) QT-8100
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QT-7000 Series IC Test System£¨Cable Mount£©QT-7200
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Discrete Device Test System QT-6000
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Discrete Device Test System QT-4100
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QT-3109 DR
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QT-3105 TRR:
EAS Tester QT-3101
Thermoresistance Tester QT-3102
MOSFET RG/CG Test System QT-3107

Test System

QT-3000 SeriesMOSFET RG/CG Test System QT-3107

MOSFET RG/CG Test System QT-3107

Self-developed LCR Mosfet RG/CG test can be used to test capacitance of diodes, with a resolution of 1fF.

Major Technical Specs:

Rg Test Specification:

Parameters

Min

Max

Unit

Resolution Ratio

Gate Resistance

0.2

50

Ohms

¡À0.1

Frequency


1

Mhz

¡À0.000343

Level

0.01

1

Vpp

N/A

Measurement Tolerance

-0.2

+0.2

Ohms

N/A

Test Time

10m

120m

s

¡À2ms

* PowerTECH reserves the right to modify these parameters without prior notice.

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