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QT-9000 Series
QT-9000 Series Large Scale IC Test System(Direct Mount)QT-9000
QT-8000 Series
QT-8000 Series Mixed-Signal TC Test System(Cable Mount) QT-8100
QT-8000 Series Mixed Signal IC Test System(Direct Mount)QT-8200
QT-8000 Series High Power Mixed Signal IC Test System(Cable Mount)QT-8100HP
QT-7000 Series
QT-7000 Series IC Test System(Cable Mount)QT-7200
QT-6000 Series
Discrete Device Test System QT-6000
QT-4000 Series
Discrete Device Test System QT-4100
General Test System TB-14
QT-3000 Series
QT-3109 DR
QT-3108 SW
QT-3104 QG
QT-3105 TRR:
EAS Tester QT-3101
Thermoresistance Tester QT-3102
MOSFET RG/CG Test System QT-3107

Test System

QT-3000 SeriesQT-3109 DR

QT-3109 DR

QT-3109DR is suitable for dynamic RDON parameter test of GaN. Can be combined with QT-4100 QT-6000 QT-8000 to form a test program.
R26; Support FT or CP laboratory mass production test.
R26; Hard-Switch and Soft-Switch Hard-Switch can be<1μs.
R26; Output capacity 30A/1KV



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Add:No.16 Guangming Ave.,New Light Source
Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
Tel:+86 757 83214396
+86 757 82803659/81992331(service)


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