Test System
Power Device Testing SystemQT-4100 Comprehensive Testing System
QT-4100 discrete device test system suitable for triode diode Zener diode MOS-FET (IGBT SIC gallium nitride) J-FET Current Sense FET LDO (78XX 79XX TL431 TL432 conventional test) Optocouplers and other products and wafers. Expansion: SCR test SCANBOX Dual Gate-FET Q Plus transistor switching time (TST TR TF TON) thermal resistance test (DVDS DVCE DVBE DVF) etc.
Characteristic£º
• Wide test coverage, test circuit support voltage-limiting and current-limiting state, which able to protect the DUT effectively.
• Foolproof measurement: Voltage & current automatic self-check, automatic alarm triggered and halt if any abnormality detected.
• LOW RDON¡£
• Quick Self-test: No external load is required, able to complete in 2 minutes
• 3rd party calibration: Apply industry standard Keysight 34401A for calibration
• Built-in Oscilloscope function.
• Support multiple test station data merging.
Major Technical Parameters
2022-09-22
PowerTECH Co., Ltd. successfully debu...PowerTECH Co., Ltd. successfully debuted on t...
2021-03-17
PowerTECH successfully exhibited in S...Semicon China 2021 was successfully held at S...
2019-03-22
PowerTECH successfully participated i...Semicon China 2019 was held at Shanghai New I...
Do more for semicon China
Add:No.16 Guangming Ave.,New Light Source
Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
Tel£º+86 757 83214396
+86 757 82803659/81992331(service)
Add:F-5-13, (The Latitude), Jalan
C180/1, Dataran C180, 43200 Batu 11 Cheras,
Selangor Darul Ehsan
We have developed a close and persistent relationship with our customers, with the increasing of global automation, we will do our utmost to accurately satisfy our customer¡¯s needs and improve the diversity of our products and applications. We will work tirelessly on pursuing stable and reliable product quality, in order to meet our customer¡¯s needs.