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QT-9000 Series
VLSI Test System QT-9000
QT-8000 Series
Analog & Digital Mixed Signal IC test System (Cable Mount) QT-8100
Analog & Digital Mixed Signal IC Test System (Direct Mount) QT-8200
Analog & Digital Mixed Signal IC Test System QT-8100HP
QT-7000 Series
IC Test System QT-7100
Digital IC Test System QT-7200
QT-6000 Series
Hi-Speed Discrete Test System QT-6000
QT-5000 Series
Semiconductor Discrete Test System QT-5000
QT-4000 Series
Semiconductor Discrete Test System QT-4000
General Test System TB-14
QT-3000 Series
EAS Test System QT-3101B
Thermal Resistance Test System QT-3102
MOSFET RG/CG Test System QT-3107-25

Test System

QT-4000 SeriesSemiconductor Discrete Test System QT-4000

Semiconductor Discrete Test System QT-4000

QT-4100 Discrete device test system is developed for Transistor Diode Zener diode MOS-FET J-FET Current Sence FET IGBT LDO(78XX 79XX Tl431 TL432 regular test) and 4 pin Photoelectric Coupler Wafer etc. R26;High test coverage current work under restrained current and voltage which could protect device effectively. R26;Capable of high accuracy sub-mΩ test. R26;Quick self-diagnosis< 2 minutes without external device. R26;Third party calibration with Agilent 34401A.

Major Technical Parameters

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