Hi-Speed Discrete Test System QT-6000

Application Features
 
• Hi-speed test to match Handler with UPH above 56K.
• FT/QA retest can mostly prevent test escapee.
• Available parallel test to achieve multi-channel and multi-die test.
 
QT-6166 is able to perform 8 pcs of transistors ping-pong test in
one time and test time for 4 transistors in parallel test is about 40ms.
 

Major Technical Parameters