Test System
QT-6000 SeriesDiscrete Device Test System QT-6000
QT-6000 test system is applied to test small and medium-sized power triode diode MOS-FET(IGBT) and wafer etc. updated system can cover built-in capacitance(DC+CAP) and Scanbox test.
The characteristics of£º
¡¤ High-speed test, UPH>40K
¡¤ One for two to achieve 100% FT+QA parallel test
¡¤ Advanced capacitor high-speed test program to achieve CAP+DC same-station test
¡¤ Built-in UIS test program to achieve DC+UIS same-station test
¡¤ LCR accurate capacitance test, the minimum test capacitance value is 100fF
Major Technical Parameters
Measurement Accuracy | Current: £¼0.5% Reading + 0.05% FullRange + 1.5nA Capacitance: 0.5% Reading + 0.05% FullRange + 10fF |
Technical indicator | Max Current/Voltage30A /1200V Capacitance Measurement range:0.2-300pF(BIAS voltage range 0~80V,1MHz) LCR Measurement Range£º0.1pF-0.1uF£¨DC Bias£º0-30V, 1MHZ£© |
DPI | 16 bit ADC/DAC |
Waveform | Built-in oscilloscope |
2021-03-17
PowerTECH successfully exhibited in S...Semicon China 2021 was successfully held at S...
2019-03-22
PowerTECH successfully participated i...Semicon China 2019 was held at Shanghai New I...
2019-03-13
The Party Secretary of Foshan, Lu yi,...On 13th March 2019, The Party Secretary of Fo...
Do more for semicon China
Add:No.16 Guangming Ave.,New Light Source
Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
Tel£º+86 757 83214396
+86 757 82803659/81992331(service)
We have developed a close and persistent relationship with our customers, with the increasing of global automation, we will do our utmost to accurately satisfy our customer¡¯s needs and improve the diversity of our products and applications. We will work tirelessly on pursuing stable and reliable product quality, in order to meet our customer¡¯s needs.