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QT-9000 Series
VLSI Test System QT-9000
QT-8000 Series
Analog & Digital Mixed Signal IC test System (Cable Mount) QT-8100
Analog & Digital Mixed Signal IC Test System (Direct Mount) QT-8200
Analog & Digital Mixed Signal IC Test System QT-8100HP
QT-7000 Series
IC Test System QT-7100
Digital IC Test System QT-7200
QT-6000 Series
Hi-Speed Discrete Test System QT-6000
QT-5000 Series
Semiconductor Discrete Test System QT-5000
QT-4000 Series
Semiconductor Discrete Test System QT-4000
General Test System TB-14
QT-3000 Series
EAS Test System QT-3101B
Thermal Resistance Test System QT-3102
MOSFET RG/CG Test System QT-3107-25

Test System

QT-6000 SeriesHi-Speed Discrete Test System QT-6000

Hi-Speed Discrete Test System QT-6000

QT-6000 Test System with built-in capacitance test (DC+CAP) and Scanbox etc is applicable to devices like medium & small power transistors MOS-FET diodes and Wafer.

 

Application Features
 
• Hi-speed test to match Handler with UPH above 56K.
• FT/QA retest can mostly prevent test escapee.
• Available parallel test to achieve multi-channel and multi-die test.
 
QT-6166 is able to perform 8 pcs of transistors ping-pong test in
one time and test time for 4 transistors in parallel test is about 40ms.

 

QT-6166 can ping pong test 8 transistors, the test time for 4 transistor in 
parallel test is about 40ms.

Major Technical Parameters
moreNews
 

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