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IC test system
QT-8100 Mixed Signal IC Test System (Cable-Mount)
QT-8200 Mixed Signal IC Test System (Hard-Docking)
QT-9000 Large Scale Integrated Circuit Test System (Direct-Mount)
QT-8100HP Analog IC Test System (Cable-Mount)
RF6G Test module
Power module and device testing system
QT-8400PIM high-power dynamic and static comprehensive test system
QT-8400GaN Gallium Nitride Test System
QT-8400D power device multi-site test system
QT-8400IPM Intelligent Power Module Test System
Discrete Device High-Speed Testing System
Discrete Device Test System QT-6000
Power Device Testing System
QT-DRM101000 Gallium Nitride Dynamic RDON
QT-3108 SW IGBT/SIC Dynamic Testing
QT-3104 QG Gate Charge Testing
QT-3105 TRR Diode Reverse Recovery Testing
QT-4100 Comprehensive Testing System
QT-3101 UIL Test
QT-3102 Thermal Resistance Tester
QT-3107 LCR RG/CG Testing

Test System

Discrete Device High-Speed Testing SystemDiscrete Device Test System QT-6000

Discrete Device Test System QT-6000

QT-6000 test system is applied to test small and medium-sized power triode diode MOS-FET(IGBT) and wafer etc. updated system can cover built-in capacitance(DC+CAP) and Scanbox test.

The characteristics of£º

¡¤ High-speed test, UPH>40K

¡¤ One for two to achieve 100% FT+QA parallel test

¡¤ Advanced capacitor high-speed test program to achieve CAP+DC same-station test

¡¤ Built-in UIS test program to achieve DC+UIS same-station test

¡¤ LCR accurate capacitance test, the minimum test capacitance value is 100fF


Major Technical Parameters

Measurement Accuracy

Current: £¼0.5% Reading + 0.05% FullRange + 1.5nA
Voltage: £¼0.5% Reading + 0.05% FullRange + 1.5mV

Capacitance: 0.5% Reading + 0.05% FullRange + 10fF

Technical indicator

Max Current/Voltage30A /1200V

Capacitance Measurement range:0.2-300pF(BIAS voltage range 0~80V,1MHz)

LCR Measurement Range£º0.1pF-0.1uF£¨DC Bias£º0-30V, 1MHZ£©


DPI

16 bit  ADC/DAC

Waveform

Built-in oscilloscope


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Industrial Base,Nanhai National High-tech Zone,
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Tel£º+86 757 83214396
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