Test System
Power Device Testing SystemQT-3101 UIL Test
QT-3101 UIL test is suitable for testing parameters of MOSFET¡¢IGBT and diodes.
Output Measurement Capabilities£ºMaximum measurement Bvdss:¡À3000V Maximum output ID: ¡À150V ¡¢¡À200A.
Editable VG MAX: ¡À30V pulse width adjustment(resolution£º1us).
Programmable inductor box load 10¦ÌH-159.9mH in steps of 10¦ÌH.
Programmable sorter interface signals: 24
Product Advantages£º
•Support VDD ON(E=1/2L*I*I*BVDSS/(BVDSS-VDD))or VDD OFF(E=1/2*L*I*I)Testing.
• Built in oscilloscope.
• Maximum current and voltage depend on the model, with maximum currents of 20A and 50A, and maximum voltages of 100V and 200 V respectively.
• Configurable for single-pulse, multi-pulse, or dual MOSFET testing
• Can be used with QT-4100B, sharing a single computer for unified test program and data management.
* The company reserves the right to revise all technical parameters at any time without prior notice.
2022-09-22
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2021-03-17
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2019-03-22
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Add:No.16 Guangming Ave.,New Light Source
Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
Tel£º+86 757 83214396
+86 757 82803659/81992331(service)
Add:F-5-13, (The Latitude), Jalan
C180/1, Dataran C180, 43200 Batu 11 Cheras,
Selangor Darul Ehsan
We have developed a close and persistent relationship with our customers, with the increasing of global automation, we will do our utmost to accurately satisfy our customer¡¯s needs and improve the diversity of our products and applications. We will work tirelessly on pursuing stable and reliable product quality, in order to meet our customer¡¯s needs.