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IC测试系统
QT-8100 Series Mixed-Signal TC Test System(Cable Mount)
QT-8200 Series Mixed Signal IC Test System(Direct Mount)
QT-9000 Series Large Scale IC Test System(Direct Mount)QT-9000
QT-8100HP Series High Power Mixed Signal IC Test System(Cable Mount)
RF6G Test module
功率模块及器件测试系统
QT-8409PIM
QT-8400GaN
QT-8400D
QT-8400IPM
Discrete Device High-Speed Testing System
Discrete Device Test System QT-6000
Power Device Testing System
QT-DRM101000 Gallium Nitride Dynamic RDON
QT-3108 SW IGBT/SIC Dynamic Testing
QT-3104 QG Gate Charge Testing
QT-3105 TRR Diode Reverse Recovery Testing
QT-4100 Comprehensive Testing System
QT-3101 UIL Test
QT-3102 Thermal Resistance Tester
QT-3107 LCR RG/CG Testing

Test System

Power Device Testing SystemQT-DRM101000 Gallium Nitride Dynamic RDON

QT-DRM101000 Gallium Nitride Dynamic RDON

QT-3109DR is designed for testing Gallium Nitride dynamic RDON parameters. It can be used in conjunction with QT-4100, QT-6000, and QT-8000 to create a comprehensive testing solution.
Supports FT or CP, suitable for both laboratory and mass production testing.
Both hard switching and soft switching are available. Hard switching can achieve RDON measurements in less than 1 microsecond.
Output capacity: 10A/1000V

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