Test System
Power Device Testing SystemQT-3107 LCR RG/CG Testing
In house LCR MOSFET RG/CG testing£¬also applicable for capacitance testing of diodes with a resolution of 1fF.
Major Technical Specs:
Parameters | Min | Max | Unit | Resolution Ratio |
Gate Resistance | 0.2 | 50 | Ohms | ¡À0.1 |
Frequency | 1 | Mhz | ¡À0.000343 | |
Level | 0.01 | 1 | Vpp | N/A |
Measurement Tolerance | -0.2 | +0.2 | Ohms | N/A |
Test Time | 10m | 120m | s | ¡À2ms |
* PowerTECH reserves the right to modify these parameters without prior notice.
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Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
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