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QT-8100 Series Mixed-Signal TC Test System£¨Cable Mount)
QT-8200 Series Mixed Signal IC Test System£¨Direct Mount£©
QT-9000 Series Large Scale IC Test System£¨Direct Mount£©QT-9000
QT-8100HP Series High Power Mixed Signal IC Test System£¨Cable Mount£©
RF6G Test module
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QT-8409PIM
QT-8400GaN
QT-8400D
QT-8400IPM
Discrete Device High-Speed Testing System
Discrete Device Test System QT-6000
Power Device Testing System
QT-DRM101000 µª»¯ïض¯Ì¬RDON
QT-3108 SW IGBT/SIC Dynamic Testing
QT-3104 QG
QT-3105 TRR:
QT-4100 Comprehensive Testing System
EAS Tester QT-3101
Thermoresistance Tester QT-3102
MOSFET RG/CG Test System QT-3107LCR

Test System

Power Device Testing SystemQT-3108 SW IGBT/SIC Dynamic Testing

QT-3108 SW IGBT/SIC Dynamic Testing

QT-3108SW is suitable for IGBT or SIC MOSFET double-pulse or single-pulse switch parameter testing.
Testing Range£º2000V/600A£¬ISC short-circuit current 1000A.
Testing Parameters£ºSwitch parameters¡¢ISC¡¢TRR QRR¡¢QG and various other parameters.
Testing Accuracy£ºBandwidth 500MHZ, sampling 5GHZ.



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