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QT-8100 Series Mixed-Signal TC Test System(Cable Mount)
QT-8200 Series Mixed Signal IC Test System(Direct Mount)
QT-9000 Series Large Scale IC Test System(Direct Mount)QT-9000
QT-8100HP Series High Power Mixed Signal IC Test System(Cable Mount)
RF6G Test module
Discrete Device High-Speed Testing System
Discrete Device Test System QT-6000
Power Device Testing System
QT-DRM101000 氮化镓动态RDON
QT-3108 SW IGBT/SIC Dynamic Testing
QT-3104 QG Gate Charge Testing
QT-3105 TRR Diode Reverse Recovery Testing
QT-4100 Comprehensive Testing System
EAS Tester QT-3101
Thermoresistance Tester QT-3102
MOSFET RG/CG Test System QT-3107LCR

Test System

Power Device Testing SystemQT-3105 TRR Diode Reverse Recovery Testing

QT-3105 TRR Diode Reverse Recovery Testing

QT-3105TRR is suitable for testing parasitic diodes in MOSFET and diodes, including dynamic inductance load testing for TRR, QRR and IRM.
Output Capability: IF 100A VR 1KV di/dt>1000A, measurement resolution 0.1ns.


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Industrial Base,Nanhai National High-tech Zone,
Foshan,Guangdong, China
Tel:+86 757 83214396
+86 757 82803659/81992331(service)
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C180/1, Dataran C180, 43200 Batu 11 Cheras,
Selangor Darul Ehsan

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